10th Small Systems Simulation Symposium

Join leading researchers and practitioners in the field of system simulation at the University of Niš, Faculty of Electronic Engineering

February 12-14, 2026 | University of Niš, Faculty of Electronic Engineering

An Overview of On-Chip Sensing and Analytics for Resilient Integrated Circuits

https://doi.org/10.46793/SSSS2026.064A



Authors:

  • Marko Andjelković

    IHP - Leibniz Institut for High Performance Microelectronics, Frankfurt (Oder), Germany

    https://orcid.org/0000-0001-6419-2062

  • Rizwan Tariq Syed
    https://orcid.org/0000-0001-9232-734X

    IHP - Leibniz Institut for High Performance Microelectronics, Frankfurt (Oder), Germany


  • Markus Ulbricht
    https://orcid.org/0000-0001-9230-640X

    IHP - Leibniz Institut for High Performance Microelectronics, Frankfurt (Oder), Germany


  • Fabian Vargas
    https://orcid.org/0000-0002-3871-6464

    IHP - Leibniz Institut for High Performance Microelectronics, Frankfurt (Oder), Germany


  • Zoran Perić
    https://orcid.org/0000-0002-8267-9541

    Faculty of Electronic Engineering, Niš, Serbia


  • Milan Dinčić
    https://orcid.org/0000-0002-8267-9541

    Faculty of Electronic Engineering, Niš, Serbia


  • Jelena Nikolić
    https://orcid.org/0000-0002-3552-7211

    Faculty of Electronic Engineering, Niš, Serbia


  • Aleksandra Jovanović
    https://orcid.org/0000-0001-8809-8951

    Faculty of Electronic Engineering, Niš, Serbia


  • Dejan Cirić
    https://orcid.org/0000-0003-4974-3131

    Faculty of Electronic Engineering, Niš, Serbia


  • Tatjana Nikolić
    https://orcid.org/0000-0003-2649-4478

    Faculty of Electronic Engineering, Niš, Serbia


  • Goran Nikolić
    https://orcid.org/0000-0002-3745-7878

    Faculty of Electronic Engineering, Niš, Serbia


  • Jelena Nedeljković
    https://orcid.org/0009-0002-2547-8935

    Faculty of Electronic Engineering, Niš, Serbia


  • Sofija Perić
    https://orcid.org/0009-0002-6523-4740

    Faculty of Electronic Engineering, Niš, Serbia


  • Nikola Vucić
    https://orcid.org/0000-0003-4781-8566

    Faculty of Electronic Engineering, Niš, Serbia


  • Miloš Krstić
    https://orcid.org/0000-0003-0267-0203

    IHP - Leibniz Institut for High Performance Microelectronics, Frankfurt (Oder), Germany



    The paper is available at the following link: PDF



    Abstract:

    Resilient integrated circuits (ICs) are essential for safety- and mission-critical applications, where hardware faults can result in costly damage or even loss of lives. A resilient IC is designed to detect, tolerate, and adapt in real time to different faulty scanarios, maintaining correct functionality under varying operating and environmental conditions. Specialized sensing and analytics engines embedded in the chip play a central role in resilient ICs by providing real-time insight into the overall state, i.e., "health", of the chip. This paper presents an overview of commonly used on-chip sensors for IC status monitoring, and discusses fundamental design requirements for on-chip processing of sensor-generated data.



    Keywords:

    Resilient integrated circuits, on-chip sensors, self- awareness, self-adaptivity.



    REFERENCES:

    [1] Reliability Risks Arise as Chip Technology Advances. Online: https://www.eetimes.com/reliability-risks-arise- as-chip-technology-advances/.
    [2] N. Dutt et al., "Toward Smart Embedded Systems: A Self-Aware System-On-Chip (SoC) Perspective," ACM Transactions on Embedded Computing Systems, 2016.
    [3] F. Vargas et al., "Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing and Data Insights," in Proc. ETS, 2025.
    [4] R. C. Baumann, "Radiation-Induced Soft Errors in Advanced Semiconductor Technologies," IEEE Tran- sactions on Device and Materials Reliability, 2005.
    [5] K. Ljilja, "Environment and Devices SER - Modeling Neutrons and Heavy Ion SER, from Planar CMOS to FinFETs," in Proc. NSREC, 2016.
    [6] H. Amrouch et al., "Towards Interdependencies of Aging Mechanisms," in Proc. ICCAD, 2014.
    [7] S. Hsueh et al., "TASSER: A Temperature-Aware Statistical Soft Error Rate Analysis Framework for Combinational Circuits," in Proc. ISQED, 2014.
    [8] S. Kiamehr et al., "Chip-Level Modeling and Analysis of Electrical Masking of Soft Errors," in Proc. VTS, 2013.
    [9] N. Mahatme et al., "Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process," IEEE Transactions on Nuclear Science, 2011.
    [10] A. Simevski, E. Hadzieva, R. Kraemer, M. Krstic, "Scalable Design of a Programmable NMR Voter with Input States' Descriptor and Self-Checking Capability," in Proc. AHS, 2012.
    [11] L. Zussa et al., "Efficiency of a Glitch Detector Against Electromagnetic Fault Injection," in Proc. DATE, 2014.
    [12] R. Velegalati, K. Shah, J.-P. Kaps, "Glitch Detection in Hardware Implementations on FPGA Using Delay- Based Sampling Technique," in Proc. DSD, 2013.
    [13] M. Andjelković et al., "Voltage Glitch Filter and Detectors with Self-Checking Capability for FPGA Implementation," in Proc. MIEL, 2023.
    [14] M. Andjelkovic, J. Chen, A. Simevski, Z. Stamen- kovic, M. Krstic, R. Kraemer, "A Review of Particle Detectors for Space-Borne Self-Adaptive Fault-Tolerant Systems," in Proc. EWDTS, 2011.
    [15] A. Amouri, M. Tahoori, "A Low Cost Sensor for Aging and Late Transition Detection in Modern FPGAs," in Proc. Int. Conf. FPL, 2011.
    [16] D. Sengupta, S. Sapatnekar, "Predicting Circuit Aging Using Ring Oscillators," in Proc. ASP-DAC, 2014.
    [17] F. Vargas, A. Balakrishnan, "On-Chip Aging Sensor Core for Silicon Lifecycle Management," in Proc. LATS, 2025.
    [18] R. Baranowski, A. Cook, M. Imhof, C. Liu, H. J. Wunderlich, "Synthesis of Workload Monitors for Online Stress Prediction," in Proc. DFTS, 2013.
    [19] G. Korkian et al., "Exploration of Ring Oscillator Based Temperature Sensors Network Accuracy on FPGA," in Proc. CADS, 2017.
    [20] L. Chen et al., "Solar Particle Event and Single Event Prediction from SRAM-based Monitor and Supervised Machine Learning," IEEE Transactions on Emerging Topics in Computing, 2022.
    [21] M. Ulbricht et al., "The TETRISC SoC - A Resilient Quad-Core System Based on the ResiliCell Approach," Microelectronics Reliability, 2023.
    [22] PULP platform. Online: https://pulp-platform.org/.
    [23] R. T. Syed et al., "Towards Reconfigurable CNN Accelerator for FPGA Implementation," IEEE Tran- sactions on Circuits Systems II: Express Briefs, 2023.
    [24] M. Andjelkovic et al., "A Resilient Processing Platform for 6G Wireless Communications Networks," in Proc. MIEL, 2025.



  • Sponsored by:

    Placeholder image Placeholder image Placeholder image